Advanced Characterization Techniques in Scanning Electron Microscopy

Nano-Structure Roughening on Poly(Lactic Acid)PLA Substrates: Scanning Electron Microscopy (SEM) Surface Morphology Characterization

Scanningelectron microscopy (SEM) has been utilized  to examine  the morphology and topography alterations  in the surface of Poly(Lactic Acid)(PLA) fabrics due to UV/Ozoneirradiation. In the past decade, a growing attention in the usage of “Green Techniques” in industrial applications has been observed owing to many benefits such as low impurities and their relatively low cost to substitute th...

Advanced Image Characterization in Scanning Probe Microscopy

This work presents the application of advanced analysis processes and datamining to images produced by scanning probe microscopy in polymers samplers. These techniques are applied to two specific problems: statistical characterization of polydispersivity in films of poly (o-methoxyaniline) (POMA) and morphological analysis of substrates of polymers used to produce liquid crystals alignment.

Scanning Transmission Electron Microscopy for Nanostructure Characterization

Scanning electron microscopy for materials characterization

Current materials are usually complex in chemistry, three-dimensional in form, and of rapidly diminishing microstructural scale. To characterize such materials the scanning electron microscope (SEM) now uses a wide range of operating conditions to target the desired sample volume, sophisticated modeling techniques to interpret the data. It also uses novel imaging modes to derive new types of in...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...